Abstract Focused ion beam (FIB) is an effective tool for precise nanoscale fabrication. It has recently been employed to tailor defect engineering in functional nanomaterials such as two-dimensional transition metal dichalcogenides (TMDCs). providing desirable properties in TMDC-based optoelectronic devices. However. https://www.spidertattooz.com/USC-Trojans-9FIFTY-Snapback-Hat/